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Identification of MOSFET Working State Based on the Stress Wave and Deep Learning.

Yun BaiSongyuan LiuYunze HeLiang ChengFei LiuXuefeng Geng
Published in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
  • deep learning
  • unsupervised learning
  • machine learning
  • data sets
  • image processing
  • decision trees
  • feature extraction
  • pairwise
  • viewpoint
  • domain specific
  • decision support system
  • unsupervised feature learning