Login / Signup

Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.

Sule OzevChristian Olgaard
Published in: VTS (2004)
Keyphrases
  • frequency domain
  • data sets
  • social networks
  • computer simulation
  • lower level
  • machine learning
  • case study
  • integrated circuit
  • levels of abstraction
  • radio frequency