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Novel Series Arc Fault Detector Using High-Frequency Coupling Analysis and Multi-Indicator Algorithm.

Guanghai BaoRun JiangXiaoqing Gao
Published in: IEEE Access (2019)
Keyphrases
  • high frequency
  • low frequency
  • similarity measure
  • high quality
  • computational complexity
  • low pass
  • image sequences
  • discrete wavelet transform
  • frequency band
  • multi resolution analysis
  • low frequency coefficients