A Low-Cost TSV Test and Diagnosis Scheme Based on Binary Search Method.
Xiaolong ZhangHuiyun LiLi JiangQiang XuPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
- low cost
- experimental evaluation
- pairwise
- synthetic data
- preprocessing
- cost function
- highly efficient
- objective function
- significant improvement
- clustering method
- detection method
- support vector machine svm
- learning scheme
- fully automatic
- high precision
- matching algorithm
- binary search
- segmentation method
- detection algorithm
- real time
- input data
- k means
- artificial neural networks
- genetic algorithm