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Implementing EWMA Yield Index for Simple Linear Profiles with One-sided Specifications in Product Acceptance Determination.

Fu-Kwun WangChang-Yi HuangYeneneh Tamirat
Published in: Qual. Reliab. Eng. Int. (2017)
Keyphrases
  • simple linear
  • pairwise
  • index structure
  • hyperplane
  • feature extraction
  • wavelet transform
  • distance function
  • control charts