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A 81nW Error Amplifier Design for Ultra Low Leakage Retention Mode Operation of 4Mb SRAM Array in 40nm LSTP Technology.

Ankush MamgainAnuj Grover
Published in: SoCC (2018)
Keyphrases
  • cmos technology
  • case study
  • long term
  • power consumption
  • engineering design
  • interaction design
  • high sensitivity
  • enabling technology
  • data processing
  • design process
  • cost effective
  • times faster
  • programmable logic