De-embedding method for on-wafer RF CMOS inductor measurements.
Maria DrakakiAlkis A. HatzopoulosStylianos SiskosPublished in: Microelectron. J. (2009)
Keyphrases
- preprocessing
- synthetic data
- clustering method
- detection method
- high precision
- significant improvement
- dynamic programming
- high accuracy
- similarity measure
- objective function
- computational cost
- support vector machine
- data embedding
- neural network
- segmentation method
- input data
- cost function
- image retrieval
- decision trees