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Impact of Defect Instances for Successful Deep Learning-based Automatic Program Repair.
Misoo Kim
Youngkyoung Kim
Jinseok Heo
Hohyeon Jeong
Sungoh Kim
Eunseok Lee
Published in:
ICSME (2022)
Keyphrases
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deep learning
unsupervised feature learning
unsupervised learning
machine learning
mental models
pattern recognition
weakly supervised
deep architectures
decision making
viewpoint
decision support system
restricted boltzmann machine