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FITS: Inferring Intermediate Taint Sources for Effective Vulnerability Analysis of IoT Device Firmware.

Puzhuo LiuYaowen ZhengChengnian SunChuan QinDongliang FangMingdong LiuLimin Sun
Published in: ASPLOS (4) (2023)
Keyphrases
  • artificial intelligence
  • database
  • databases
  • neural network
  • information sources
  • real time
  • data sets
  • genetic algorithm
  • social networks
  • e learning
  • case study
  • management system
  • cost effective
  • power consumption