Modeling and Predicting Transistor Aging Under Workload Dependency Using Machine Learning.
Paul R. GensslerHamza Errahmouni BarkamKarthik PandaramMohsen ImaniHussam AmrouchPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2023)
Keyphrases
- machine learning
- inductive learning
- high speed
- learning systems
- data analysis
- data mining
- knowledge acquisition
- natural language processing
- supervised learning
- active learning
- natural language
- knowledge discovery
- information extraction
- feature selection
- computer vision
- response time
- artificial intelligence
- text classification
- genetic algorithm
- information retrieval
- transfer learning
- machine learning methods
- database
- integrated circuit
- predictive modeling
- data driven approaches