Spectroscopic Measurement of Material Properties Using an Improved Millimeter-Wave Ellipsometer Based on Metallic Substrates.
Mathias KlennerChristian ZechAxel HülsmannJutta KuhnMichael SchlechtwegOliver AmbacherPublished in: IEEE Trans. Instrum. Meas. (2016)
Keyphrases
- material properties
- millimeter wave
- finite element
- radar images
- finite element analysis
- spatially varying
- finite element model
- soft tissue
- sar imagery
- imaging process
- physical phenomena
- motion analysis
- experimental data
- motion tracking
- scale space
- viewpoint
- noisy images
- computer vision
- reconstruction process
- medical images
- high resolution