A Simple Method to Measure MTF of Paper and Its Application for Dot Gain Analysis.
Masayuki UkishimaHitomi KanekoToshiya NakaguchiNorimichi TsumuraMarkku Hauta-KasariJussi ParkkinenYoichi MiyakePublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2009)