An extended march test algorithm for embedded memories.
Gang-Min ParkHoon ChangPublished in: Asian Test Symposium (1997)
Keyphrases
- search space
- dynamic programming
- improved algorithm
- experimental evaluation
- optimal solution
- computational complexity
- computationally efficient
- theoretical analysis
- worst case
- cost function
- expectation maximization
- classification algorithm
- k means
- learning algorithm
- parallel implementation
- optimization algorithm
- path planning
- times faster
- particle swarm optimization
- computational cost
- np hard
- preprocessing
- simulated annealing
- detection algorithm
- tree structure
- matching algorithm
- artificial neural networks
- support vector
- estimation algorithm
- data sets