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A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs.
Yueh-Hua Wang
Ming-Hsiang Cho
Lin-Kun Wu
Published in:
IEICE Trans. Electron. (2009)
Keyphrases
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noise immunity
high accuracy
similarity measure
objective function
missing data
data sets
neural network
pairwise
cost function
dynamic programming
probabilistic model
support vector machine
image registration
input data
image denoising
parameter values