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Comparing Quality Measures for Contrast Pattern Classifiers.
Milton García-Borroto
Octavio Loyola-González
José Francisco Martínez Trinidad
Jesús Ariel Carrasco-Ochoa
Published in:
CIARP (1) (2013)
Keyphrases
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quality measures
training data
decision trees
support vector
feature selection
training set
naive bayes
machine learning algorithms
pattern matching
svm classifier
classification accuracy
document collections
perceptual quality
structural similarity index