Defect Analysis and Defect Tolerant Design of Multi-port SRAMs.
Lushan LiuPradeep NagarajShambhu J. UpadhyayaRamalingam SridharPublished in: J. Electron. Test. (2008)
Keyphrases
- design process
- building blocks
- user interface
- quantitative analysis
- image analysis
- detailed design
- optimal design
- computer aided
- similarity measure
- multi agent
- optimal solution
- data analysis
- three dimensional
- information systems
- knowledge based systems
- statistical analysis
- computer vision
- learning algorithm
- software architecture
- information retrieval
- databases
- engineering design
- data sets
- real time