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Neg/pos-Normalized Accuracy Measures for Software Defect Prediction.

Maohua GanZeynep YücelAkito Monden
Published in: IEEE Access (2022)
Keyphrases
  • software defect prediction
  • prediction accuracy
  • multi class
  • pairwise
  • error rate
  • ensemble learning
  • feature selection
  • similarity measure
  • evaluation measures