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A 28nm fully digital voltage monitor with 16.5uV/°C accuracy and 0.8mV quantized error from -40 to 160°C for ISO26262 ASIL-D capable MCU.
Toshifumi Uemura
Yuko Kitaji
Kazuki Fukuoka
Published in:
A-SSCC (2019)
Keyphrases
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error rate
prediction accuracy
error analysis
relative error
high accuracy
computational cost
error reduction
average error
computational complexity
training set
classification accuracy
computational intelligence
power system
roc curve