Low frequency noise and technology induced mechanical stress in MOSFETs.
Paolo FantiniGiorgio FerrariPublished in: Microelectron. Reliab. (2007)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- discrete wavelet transform
- wavelet analysis
- subband
- low pass
- frequency band
- electromagnetic fields
- original images
- high frequency components
- wavelet coefficients
- visual quality
- low and high frequency
- wavelet domain
- image restoration
- high quality
- dct coefficients
- dct domain
- input image
- contourlet transform