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Fourier analysis-based automatic test pattern generation for combinational circuits.

Tolga Ayav
Published in: SIU (2015)
Keyphrases
  • fourier analysis
  • fourier transform
  • frequency domain
  • non stationary
  • fully automatic
  • logic circuits
  • spherical harmonics
  • state space
  • computer vision
  • multiscale
  • image quality
  • template matching