An efficient parameter extraction method using statistical optimization in S-CMOS deep-submicron/nanometer model.
Alex Yoondong ParkSteve H. JenBing J. SheuHeesook YoonIn Gyeom KimPublished in: ISCAS (5) (2002)
Keyphrases
- optimization process
- optimization model
- probabilistic model
- computational model
- parameter values
- power consumption
- delay insensitive
- statistical information
- optimization procedure
- linear model
- low power
- formal model
- global optimization
- statistical models
- statistical model
- mathematical model
- theoretical framework
- theoretical analysis
- optimization problems
- management system
- probability distribution