An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits.

Baojun Liu Li Cai Xiaoqiang Liu

Published in: J. Electron. Test. (2020)

Keyphrases

computational model
experimental data
similarity measure
prior knowledge
cost function
high speed
real time
objective function
theoretical analysis
theoretical framework
power supply
model based diagnosis
formal model
statistical model
probabilistic model
bayesian networks
image segmentation