Algorithm for dramatically improved efficiency in ADC linearity test.
Zhongjun YuDegang ChenPublished in: ITC (2012)
Keyphrases
- improved algorithm
- computational complexity
- optimization algorithm
- detection algorithm
- learning algorithm
- computational efficiency
- recognition algorithm
- k means
- high accuracy
- probabilistic model
- cost function
- times faster
- objective function
- high efficiency
- segmentation algorithm
- highly efficient
- tree structure
- single pass
- clustering method
- theoretical analysis
- computationally efficient
- preprocessing
- classification algorithm
- matching algorithm
- least squares
- memory requirements
- data structure
- optimal solution
- image sequences
- decision trees