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Editorial Introduction to the Special Issue on Biometrics at a Distance in the Deep Learning Era.
Manuel J. Marín-Jiménez
Shiqi Yu
Yasushi Makihara
Vishal M. Patel
Maneet Singh
Maria De Marsico
Published in:
IEEE J. Sel. Top. Signal Process. (2023)
Keyphrases
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deep learning
unsupervised learning
unsupervised feature learning
machine learning
mental models
pattern recognition
weakly supervised
restricted boltzmann machine
deep architectures
data points
data mining
computer vision
clustering algorithm
decision trees
high dimensional