Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation.
Qiyu WeiWei ZhaoXiaoyan ZhengZeng ZengPublished in: CoRR (2023)
Keyphrases
- semi supervised classification
- vector representation
- semi supervised learning
- semi supervised
- similarity measure
- labeled data
- unlabeled data
- document representation
- fixed length
- pairwise constraints
- semantic description
- support vector machine
- data points
- active learning
- data sets
- web documents
- variable length
- pairwise
- similarity computation
- machine learning