Comments on "Researcher bias: The use of machine learning in software defect prediction".
Chakkrit TantithamthavornShane McIntoshAhmed E. HassanKen-ichi MatsumotoPublished in: PeerJ Prepr. (2015)
Keyphrases
- software defect prediction
- machine learning
- sample selection bias
- feature ranking
- ensemble learning
- class imbalance
- active learning
- pattern recognition
- machine learning methods
- inductive bias
- decision trees
- feature selection
- support vector machine
- text classification
- machine learning algorithms
- learning tasks
- data mining
- imbalanced data
- labeled data
- text mining
- supervised learning
- reinforcement learning
- training data