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Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations.

Patrick ScharfChristoph SohrmannSteffen HollandVolkhard Beyer
Published in: ESSDERC (2019)
Keyphrases
  • neural network
  • real world
  • machine learning
  • social networks
  • similarity measure
  • wireless sensor networks
  • high speed
  • simulation study
  • numerical simulations