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Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors.

Wen LiYing WangKaiwei ZouHuawei LiXiaowei Li
Published in: ATS (2023)
Keyphrases
  • deep learning
  • pattern recognition
  • pairwise
  • computer vision
  • decision making
  • feature space
  • probabilistic model
  • object detection
  • unsupervised learning