Localization of Defects Via Residence Time Measures.

Alessandro Ciallella Emilio N. M. Cirillo Barbara Vantaggi

Published in: SIAM J. Appl. Math. (2022)

Keyphrases

evaluation measures
object localization
real world
data structure
ground truth
source localization
computer vision
decision trees
learning environment
artificial neural networks
precision and recall
quality measures
optic disc
complexity measures