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The Impact of a Number of Samples on Unsupervised Feature Extraction, Based on Deep Learning for Detection Defects in Printed Circuit Boards.
Ihar Volkau
Abdul Mujeeb
Wenting Dai
Marius Erdt
Alexei Sourin
Published in:
Future Internet (2022)
Keyphrases
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deep learning
printed circuit boards
feature extraction
unsupervised learning
weakly supervised
knowledge discovery
semi supervised
machine learning
image processing
pattern recognition
supervised learning
training examples
deep architectures