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An ultra-low voltage RRAM read-out technique employing dithering principles.

Jinling XingAlexander SerbThemistoklis Prodromakis
Published in: ISCAS (2016)
Keyphrases
  • low voltage
  • design considerations
  • high speed
  • power line
  • cmos technology
  • power management
  • real time
  • e learning
  • error diffusion