Sign in
Analysis of a 5.5-V Class-D Stage Used in +30-dBm Outphasing RF PAs in 130- and 65-nm CMOS.
Jonas Fritzin
Christer Svensson
Atila Alvandpour
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2012)
Keyphrases
</>
data analysis
database
image retrieval
image analysis
low cost
neural network
computer vision