Guest Editorial: Special Issue on the 2013 IEEE International Instrumentation and Measurement Technology Conference Minneapolis, MN, USA, May 6-9, 2013.
Dario PetriSergey KharkovskyPublished in: IEEE Trans. Instrum. Meas. (2014)
Keyphrases
- special issue
- ai edam
- international journal
- applied intelligence
- ecml pkdd
- data acquisition
- databases and information systems
- special section
- san diego
- computer society
- ultra wide band
- advanced technology
- stanford university
- selected papers
- expert systems
- acm conference
- machine learning
- national science foundation
- knowledge management
- artificial intelligence