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Wafer-specific centering of compact transistor model parameters for advanced technologies and models.

Bart A. De VriesAndries J. ScholtenP. F. E. RommersM. StoutjesdijkDirk B. M. Klaassen
Published in: CICC (2011)
Keyphrases
  • lessons learned
  • integrated circuit
  • real world
  • data mining
  • genetic algorithm
  • recent progress