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Cost-Effective Test Optimized Scheme of TSV-Based 3D SoCs for Pre-Bond Test.

Kele ShenDong XiangZhou Jiang
Published in: ISVLSI (2014)
Keyphrases
  • cost effective
  • low cost
  • database
  • data mining
  • machine learning
  • long term
  • anomaly detection
  • statistical significance