The Impact of Correlated Metrics on the Interpretation of Defect Models.

Jirayus Jiarpakdee Chakkrit Tantithamthavorn Ahmed E. Hassan

Published in: IEEE Trans. Software Eng. (2021)

Keyphrases

information systems
probabilistic model
feature selection
multiscale
statistical models
information retrieval
website
case study
three dimensional
feature extraction
hidden markov models
probability distribution
parameter estimation
statistical model
experimental data
image interpretation