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Microcontroller susceptibility variations to EFT burst during accelerated aging.
J. Wu
C. Li
B. Li
W. Zhu
H. Wang
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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low cost
control system
age estimation
real time
design considerations
age related
data sets
neural network
image processing
database systems
process control
wet lab