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Microcontroller susceptibility variations to EFT burst during accelerated aging.

J. WuC. LiB. LiW. ZhuH. Wang
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • low cost
  • control system
  • age estimation
  • real time
  • design considerations
  • age related
  • data sets
  • neural network
  • image processing
  • database systems
  • process control
  • wet lab