Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits.
Yiming LiChih-Hong HwangTa-Ching YehTien-Yeh LiPublished in: ICCAD (2008)
Keyphrases
- high frequency
- integrated circuit
- metal oxide semiconductor
- low frequency
- power supply
- high resolution
- circuit design
- visual quality
- wavelet transform
- subband
- high frequencies
- discrete wavelet transform
- low pass
- wavelet coefficients
- wavelet domain
- low cost
- high speed
- frequency band
- high frequency components
- multi resolution analysis
- similarity measure
- high pass
- image compression