Sensitivity analysis of a radiation immune CMOS logic family under defect conditions.

Erik H. Ingermann James F. Frenzel

Published in: VTS (1993)

Keyphrases

sensitivity analysis
managerial insights
influence diagrams
sufficient conditions
delay insensitive
x ray
variational inequalities
chip design
special case
modal logic
high speed
low cost
infrared
immune response
linear programming
classical logic
decision variables
circuit design
artificial immune
logic programming