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A saboteur and mutant based built-in self-test and counting threshold-based built-in self repairing mechanism for memories.
Gopalan Karthy
Pothiraj Sivakumar
Published in:
J. Ambient Intell. Humaniz. Comput. (2021)
Keyphrases
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neural network
evolutionary algorithm
differential evolution
data sets
case study
multiscale
multiresolution
image processing
website
computational model
integrated circuit