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The effect of annealing temperature on the electronic parameters and carrier transport mechanism of Pt/n-type Ge Schottky diode.

Erjuan GuoZhigang ZengYan ZhangXiao LongHaijun ZhouXiaohong Wang
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • simulated annealing
  • parameter settings
  • parameter estimation
  • maximum likelihood
  • expectation maximization
  • parameter values
  • input parameters
  • single parameter
  • monte carlo
  • sensitivity analysis
  • selection mechanism