Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101.
Santi Kumari BeheraShishir Prasad DashRajat AmatPrabira Kumar SethyPublished in: Int. J. Syst. Assur. Eng. Manag. (2024)
Keyphrases
- parameter tuning
- support vector machine
- ink bleed
- parameter settings
- feature vectors
- optimal parameters
- neural network
- optimal solution
- lp norm
- feature selection
- worst case
- multi class
- massively parallel
- weighting coefficients
- support vector
- svm classifier
- integrated circuit
- dynamic programming
- decision forest
- pairwise