On statistical approaches to target silhouette classification in difficult conditions.
Conrad SandersonDanny GibbinsStephen J. SearlePublished in: Digit. Signal Process. (2008)
Keyphrases
- statistical approaches
- pattern recognition
- classification scheme
- classification accuracy
- decision trees
- classification systems
- image classification
- sufficient conditions
- feature extraction
- support vector
- supervised learning
- human recognition
- classification models
- machine learning methods
- support vector machine svm
- semi supervised
- machine learning algorithms
- decision rules
- d objects
- image features
- automatic classification
- support vector machine
- training set
- feature values
- metadata
- data mining