Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS.
Gerd KieneSadik IlikLuigi MastrodomenicoMasoud BabaieFabio SebastianoPublished in: CoRR (2024)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- subband
- wavelet coefficients
- discrete wavelet transform
- low pass
- frequency band
- low cost
- cmos technology
- wavelet analysis
- low and high frequency
- high frequency components
- original images
- electromagnetic fields
- spatial domain
- low power
- power consumption
- image compression
- high resolution
- machine learning
- noisy images
- image denoising
- metal oxide semiconductor
- image processing