Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking.
Gethin NormanDavid ParkerMarta Z. KwiatkowskaSandeep K. ShuklaPublished in: VLSI Design (2004)
Keyphrases
- model checking
- temporal logic
- formal verification
- model checker
- temporal properties
- finite state
- automated verification
- pspace complete
- symbolic model checking
- finite state machines
- timed automata
- verification method
- formal specification
- transition systems
- bounded model checking
- process algebra
- partial order reduction
- reachability analysis
- formal methods
- computation tree logic
- reactive systems
- asynchronous circuits
- binary decision diagrams
- bayesian networks
- artificial intelligence
- linear temporal logic