Supervised Pun Detection and Location with Feature Engineering and Logistic Regression.
Jingyuan FengÖzge SevgiliSteffen RemusEugen RuppertChris BiemannPublished in: SwissText/KONVENS (2020)
Keyphrases
- logistic regression
- feature engineering
- chi square test
- decision trees
- support vector
- machine learning
- text classification
- naive bayes
- logistic regression models
- credit scoring
- breast cancer
- linear support vector machines
- odds ratio
- loss function
- dependency parsing
- chi square
- logistic model
- feature selection
- supervised learning
- predictor variables
- artificial intelligence
- data mining
- expert systems
- belief nets
- learning algorithm
- linear svm
- image processing
- neural network
- unsupervised learning
- bayesian networks
- semi supervised
- active learning