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A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET.
M. Z. Dai
S. I. Kim
Andrew Yap
Shaohua Liu
Arthur Cheng
Leeward Yi
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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high voltage
active learning
contrast agent