Login / Signup

Stability Analysis of Monolithic GaN MIS-HEMT Comparator with Device PBTI and Circuit Stress Tests.

Ang LiYi ShenZiqian LiYuhao ZhuHuiqing WenWen Liu
Published in: ASICON (2021)
Keyphrases
  • stability analysis
  • nonlinear systems
  • semiconductor devices
  • gravitational search algorithm
  • sliding mode
  • stability margin
  • real time
  • artificial intelligence
  • equivalent circuit
  • fault tolerant control
  • neural network