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Role of Gate Hole Injection in Minimizing Substrate Coupling and Electron Trapping in AlGaN/GaN Power HEMTs.
A. Cavaliere
Carlo De Santi
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
Published in:
IRPS (2024)
Keyphrases
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power consumption
database
data sets
total energy