Benefits of IEEE-754 Features in Modern Symmetric Tridiagonal Eigensolvers.

Osni Marques E. Jason Riedy Christof Vömel

Published in: SIAM J. Sci. Comput. (2006)

Keyphrases

feature extraction
feature vectors
low level
classification accuracy
feature set
image features
key features
artificial intelligence
high level
prior knowledge
text classification
false positives
structural information
specific features