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Benefits of IEEE-754 Features in Modern Symmetric Tridiagonal Eigensolvers.
Osni Marques
E. Jason Riedy
Christof Vömel
Published in:
SIAM J. Sci. Comput. (2006)
Keyphrases
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feature extraction
feature vectors
low level
classification accuracy
feature set
image features
key features
artificial intelligence
high level
prior knowledge
text classification
false positives
structural information
specific features